|
Journal
|
2013 |
Unusual Instability Mode of Transparent All Oxide Thin Film Transistor under Dynamic Bias Condition
Oh Himchan Applied Physics Letters, v.103, no.12, pp.1-5 |
3 |
원문
|
|
Journal
|
2012 |
Effect of Oxygen Binding Energy on the Stability of Indium-Gallium-Zinc-Oxide Thin-Film Transistors
Cheong Woo-Seok ETRI Journal, v.34, no.6, pp.966-969 |
8 |
원문
|
|
Journal
|
2009 |
Effects of Interfacial Dielectric Layers on the Electrical Performance of Top-Gate In-Ga-Zn-Oxide Thin-Film Transistors
Cheong Woo-Seok ETRI Journal, v.31, no.6, pp.660-666 |
26 |
원문
|
|
Journal
|
2008 |
Effects of Gate Bias Stress on the Electrical Characteristics of ZnO Thin Film Transistor
전재홍 Journal of the Korean Physical Society, v.53, no.1, pp.412-415 |
8 |
원문
|
|
Conference
|
2008 |
P‐22: Electrical Stability of ZnO TFT during Gate‐Bias Stress
김태현 Society for Information Display (SID) International Symposium 2008, pp.1250-1253 |
1 |
원문
|