ETRI-Knowledge Sharing Plaform

Metal-Insulator Transition Holographic Display Fresnel Hologram Numerical Simulations Mott Transition Insulator-To-Metal Transition Vanadium Dioxide Films First-Order Sol-Gel Method Digital Hologram Resistance Change Si Substrate Focal Length Annealing Temperature Rf-Magnetron Sputter Deposition Applied Physics Vanadium Oxide Infrared Microscopy Structural Phase Transition Charge Carriers Transition Temperature Increasing Temperature Metal Phase Large-Scale Wide Viewing Angle High Order Fourier Hologram Sol-Gel Process Tilted Plane On-Axis Fourier Holographic Metallic State System Matrix Vanadium Dioxide Thin Film Focal Plane Image Deformation Light Source Comparative Analysis Deep Learning(DL) Sio 2 Hole Doping Polarization-Insensitive Plane Wave Room-Temperature Strain And Temperature Surface Morphology Abrupt Change Correlated Insulator Correlated Material Temperature Sensor(LM35) VO 2 Viewing Window Hologram Aperture Sputter Deposition Technique Display System Holographic Imaging Image Size Lens Array Self-Similarity Affine Transformation Coulomb Repulsion Faraday Rotator Mirror Image Recovery Infrared Spectroscopy(FT-IR in real time) Low Pressure Long-Period Fiber Grating(LPFG) Pupil Tracking Wide-Angle High-Birefringent Fiber Electronic Correlations Nano-Imaging Optical Fiber Point Spread Function(PSF) Reconstructed Image Correlated Metal Far-Infrared Field Of View(FOV) Image Reconstruction Memristive System Second-Order Tracking System As-Deposited Film Amplitude Contrast Control Systems Backlight System Dielectric Tensor Tuning Effect Valence Band Projection System W Doping 3d Scenes Electrical Properties(I-V curve) Frequency Tuning Intermediate Phase Interface Region Iterative Shrinkage-Thresholding Laser-Assisted X-Ray Phase-Contrast Imaging Motor Control Matrix Element Nanoparticle Size Neural Network Architecture Optical Constants O 3 Polarized Light Phase Gradient Process Temperature Resonance Frequency Real-Time Tuning Sensing Scheme Two-Step Tracking Technique Coherent Phonon Constant Voltage(CV) Beam Splitter Thermal Sensors Electrostatic Doping Femtosecond Pump-Probe Focused Laser High-Precision Imaging Plane Image Generation Low Concentration Mems Mirror Network Image Operating Pressure Object Image Polarization Independent Polarization-Diversity Loop Configuration Preliminary Study Pulsed-Laser Deposition(PLD) Regularization Technique Quasi-One-Dimensional Refractive Index Spatial Light Modulator(SLM) Current Path Crystalline Grain Dynamic Tuning Blood Cells Beam Geometry Thickness Variation Thin-Film Devices Video Service Upper Limit Simultaneous Measurement Image Retrieval Effective Medium Theory Experimental Data Electric Circuit Free Electrons Film Thickness Field-Effect Transistors(FETs) Fresh Dimension Gate Dielectric High-Tc Superconductors High-Resolution Horizontal Axis Infrared Absorption Internal Structure Impurity Level Input Data Laser Light Low-Temperature Plasma-Enhanced Atomic Layer Deposition Metal State Optimization Algorithm Postdeposition Annealing(PDA) Post-Annealing Process Strongly Correlated Semiconductor Device Statistical Analysis Split-Ring Resonator Activation Energy Aperture Size Correlated Electron Systems Chebyshev Polynomials Of The Second Kind Device Fabrication Valence State 3d Image Weighting Matrix Kernel Matrix Electronic State Fundamental Limitation Free Carriers Force Microscopy Fresnel Diffraction Hybrid Structure Infrared Data Image Formation Magnetic Particles Multi-Layer Network Oscillation Frequency Parallel-Beam Phase Coexistence Passive Circuits Quantitative Analysis Resolution Enhancement Sampling Criterion Si Wafer Spatial Resolution Total Variation Regularization Three-Dimensional Display Tele-Presence As 2 Computed Tomography(C.T) Basis Vectors Tensor Tomography Process-Voltage-Temperature(PVT) 3d Panel Wave Length Index Generation Electronic Properties Frequency Range Far-Field And Near-Field Gate Voltage Grain Boundaries Gaas Thin Films Growth Temperature Infrared Study Kinetic Energy M-Plane Mixed Phases Nonequilibrium State Network Training Optical Properties Optical System Pressure Range Phase Change Spectral Weight Amorphous Films Atomic Force Microscope(AFM) Condition Number Carry Out Conduction Band Doping Amount Display Applications Binocular Disparity Diffraction Tomography Two-Terminal Device Two-Dimensional(2D) Transition Regime Time Scale Vanadium Sesquioxide Voltage Source Video System W-Doped Exact Reconstruction Electrical Gating Experimental Approach Electromagnetic Properties Electrical Oscillation Fourier Transform Free Region Infrared Properties Induced Resistance Image Reduction Inverse System Initial Stage Liquid Crystal Display(LCD) Laser Beams Linear Characteristic Multi-View Memory Device Metallic Islands Magnetic Particle Imaging Nyquist Sampling Normal Incidence Network Performance Nonlinear Activation Function One-Dimensional Chains Oriented Films Potential Applications Sparse-View Ct Standard Resistor Single-Crystalline Spectrum Expansion Aliasing Effect Temperature Dependence Ti-Doped Theoretical Analysis Learning-Based 3d Display Interference Filter Key Role Electrical Characteristics Fiber Optic Frequency-Agile Frequency Response(FreRes) Growth Method Infrared Image Lcd Panel Light Guide Low-Valent Microscopic Observation Micro-Electro-Mechanical System(MEMS) Mean Curvature Optical Conductivity Optical Diffraction Order Structure P-Type Preferred Orientation Resistance Variation Quasi-Particle Reducing Gases Shrinkage Algorithm Single-Layer Network Spatial Harmonic Twist Algorithm Applied Voltage Angular Spectrum Chamber Pressure Critical Temperature Charge Dynamics Doping Concentration Ti Doping Joule Heating Uniform Image 3d Video Xrd Data Extended Dipole Model Electrical Devices Frequency Bandwidth Growth Conditions High Resistance High Electric Field High Numerical Aperture Hidden Layer Large Screen Image Space Low Noise Metal Ion 1550 Nm Optical Transition Oxygen Ambient Phase Retrieval Pump-Probe Measurements Particle Mass Recovery Method Retrieval Performance Reflectance Measurements Reconstruction Process System Architecture Small Change Scanning Electron Microscope