ETRI-Knowledge Sharing Plaform

Metal-Insulator Transition Holographic Display Fresnel Hologram Mott Transition Numerical Simulations Insulator-To-Metal Transition Vanadium Dioxide Films First-Order Sol-Gel Method Digital Hologram Resistance Change Fourier Hologram Si Substrate Annealing Temperature Rf-Magnetron Sputter Deposition Applied Physics Infrared Microscopy Structural Phase Transition Vanadium Oxide Charge Carriers Increasing Temperature Transition Temperature Metal Phase Large-Scale High Order Wide Viewing Angle Focal Length Sol-Gel Process Tilted Plane Metallic State On-Axis System Matrix Focal Plane Image Deformation Vanadium Dioxide Thin Film Sio 2 Comparative Analysis Hole Doping Plane Wave Polarization-Insensitive Room-Temperature Surface Morphology Strain And Temperature Sputter Deposition Technique Abrupt Change Correlated Insulator Correlated Material Hologram Aperture Temperature Sensor(LM35) VO 2 Viewing Window Display System Image Size Light Sources Lens Array Self-Similarity Affine Transformation Coulomb Repulsion Faraday Rotator Mirror Infrared Spectroscopy(FT-IR in real time) Image Recovery Pupil Tracking Long-Period Fiber Grating(LPFG) Low Pressure Electronic Correlations High-Birefringent Fiber Wide-Angle Nano-Imaging Optical Fiber Point Spread Function(PSF) Reconstructed Image Correlated Metal Far-Infrared Field Of View(FOV) Image Reconstruction Memristive System Second-Order Fourier Holographic 3d Scenes As-Deposited Film Amplitude Contrast Backlight System Control Systems Electrical Properties(I-V curve) Frequency Tuning Intermediate Phase Interface Region Iterative Shrinkage-Thresholding Tuning Effect Tracking System Laser-Assisted Matrix Element Motor Control Nanoparticle Size Neural Network Architecture Projection System Optical Constants O 3 Polarized Light Process Temperature Phase Gradient Resonance Frequency Real-Time Tuning Sensing Scheme Valence Band X-Ray Phase-Contrast Imaging W Doping Beam Splitter Constant Voltage(CV) Coherent Phonon Electrostatic Doping Femtosecond Pump-Probe Focused Laser Imaging Plane Thermal Sensors Tracking Technique Two-Step Low Concentration Network Image Object Image Operating Pressure Polarization-Independent Polarization-Diversity Loop Configuration Pulsed-Laser Deposition(PLD) Preliminary Study Quasi-One-Dimensional Regularization Technique Refractive Index Spatial Light Modulator(SLM) Beam Geometry Blood Cells Current Path Crystalline Grain Deep Learning(DL) Dynamic Tuning Electric Circuit Effective Medium Theory Experimental Data Free Electrons Film Thickness Field-Effect Transistors(FETs) Fresh Dimension High-Resolution Gate Dielectric Horizontal Axis High-Tc Superconductors Internal Structure Impurity Level Input Data Image Retrieval Infrared Absorption Thickness Variation Thin-Film Devices Upper Limit Laser Light Low-Temperature Plasma-Enhanced Atomic Layer Deposition Metal State Optimization Algorithm Post-Annealing Process Postdeposition Annealing(PDA) Simultaneous Measurement Semiconductor Device Split-Ring Resonator Strongly Correlated Statistical Analysis Video Service 3d Image Aperture Size Activation Energy Correlated Electron Systems Chebyshev Polynomials Of The Second Kind Device Fabrication Electronic State Fundamental Limitation Free Carriers Force Microscopy Fresnel Diffraction Hybrid Structure Infrared Data Image Formation Multi-Layer Network Kernel Matrix Magnetic Particles Oscillation Frequency Parallel-Beam Phase Coexistence Passive Circuits Quantitative Analysis Si Wafer Sampling Criterion Valence State Weighting Matrix 3d Panel As 2 Basis Vectors Computed Tomography(C.T) Frequency Range Far-Field And Near-Field Grain Boundaries Holographic Imaging Gaas Thin Films Growth Temperature Gate Voltage Infrared Study Index Generation Three-Dimensional Display Tele-Presence Total Variation Regularization Wave Length Kinetic Energy M-Plane Mixed Phase Optical System Nonequilibrium State Network Training Optical Properties Phase Change Pressure Range Spectral Weight Electronic Properties Process-Voltage-Temperature(PVT) Amorphous Films Atomic Force Microscope(AFM) Binocular Disparity Carry Out Condition Number Conduction Band Diffraction Tomography Display Applications Doping Amount Electromagnetic Properties Electrical Oscillation Exact Reconstruction Electrical Gating Experimental Approach Fourier Transform Free Region Image Reduction Inverse System Initial Stage Infrared Properties Induced Resistance Two-Terminal Device Transition Regime Time Scale Two-Dimensional(2D) Linear Characteristic Laser Beams Liquid Crystal Display(LCD) Magnetic Particle Imaging Metallic Islands Memory Device Nyquist Sampling Normal Incidence Network Performance Nonlinear Activation Function Oriented Films One-Dimensional Chains Potential Applications Sparse-View Ct Standard Resistor Single-Crystalline Vanadium Sesquioxide Voltage Source Video System W-Doped 3d Display Aliasing Effect Electrical Characteristics Fiber Optic Frequency-Agile Frequency Response(FreRes) Infrared Image Interference Filter Temperature Dependence Ti-Doped Theoretical Analysis Low-Valent Light Guide Learning-Based Lcd Panel Key Role Microscopic Observation Mean Curvature Optical Diffraction Order Structure Optical Conductivity P-Type Preferred Orientation Quasi-Particle Resistance Variation Reducing Gases Shrinkage Algorithm Single-Layer Network Spatial Harmonic Growth Method 3d Video Applied Voltage Charge Dynamics Chamber Pressure Critical Temperature Doping Concentration Extended Dipole Model Electrical Devices Frequency Bandwidth Joule Heating Growth Conditions High Electric Field High Numerical Aperture Hidden Layer Image Space 1550 Nm Ti Doping Twist Algorithm Uniform Image Xrd Data Large Screen Metal Ion Oxygen Ambient Optical Transition Pump-Probe Measurements Particle Mass Phase Retrieval Recovery Method Retrieval Performance Reflectance Measurements Reconstruction Process System Architecture Scanning Electron Microscope Small Change High Resistance