ETRI-Knowledge Sharing Plaform

Metal-Insulator Transition Holographic Display Fresnel Hologram Numerical Simulations Mott Transition Insulator-To-Metal Transition Vanadium Dioxide Films First-Order Resistance Change Sol-Gel Method Digital Hologram Focal Length Si Substrate Fourier Hologram Annealing Temperature Rf-Magnetron Sputter Deposition Structural Phase Transition Applied Physics Infrared Microscopy Vanadium Oxide Charge Carriers Metal Phase Transition Temperature Increasing Temperature Large-Scale High Order Wide Viewing Angle Sol-Gel Process Fourier Holographic Metallic State On-Axis System Matrix Tilted Plane Focal Plane Image Deformation Vanadium Dioxide Thin Film Comparative Analysis Deep Learning(DL) Hole Doping Polarization-Insensitive Room-Temperature Strain And Temperature Surface Morphology Sio 2 Plane Wave Abrupt Change Correlated Insulator Correlated Material Hologram Aperture Sputter Deposition Technique Temperature Sensor(LM35) Viewing Window VO 2 Display System Holographic Imaging Image Size Lens Array Light Sources Self-Similarity Affine Transformation Coulomb Repulsion Faraday Rotator Mirror Image Recovery Infrared Spectroscopy(FT-IR in real time) Long-Period Fiber Grating(LPFG) Low Pressure Pupil Tracking Electronic Correlations Nano-Imaging Optical Fiber Point Spread Function(PSF) Reconstructed Image Wide-Angle High-Birefringent Fiber Correlated Metal Field Of View(FOV) Far-Infrared Image Reconstruction Memristive System Second-Order 3d Scenes As-Deposited Film Amplitude Contrast Backlight System Control Systems Dielectric Tensor Electrical Properties(I-V curve) Frequency Tuning Iterative Shrinkage-Thresholding Interface Region Motor Control Matrix Element Nanoparticle Size Neural Network Architecture Optical Constants O 3 Polarized Light Phase Gradient Resonance Frequency Real-Time Tuning Sensing Scheme Tuning Effect Tracking System Valence Band X-Ray Phase-Contrast Imaging W Doping Intermediate Phase Laser-Assisted Projection System Process Temperature Beam Splitter Coherent Phonon Constant Voltage(CV) Electrostatic Doping Femtosecond Pump-Probe Focused Laser High-Precision Image Generation Imaging Plane Low Concentration Mems Mirror Network Image Operating Pressure Polarization-Independent Polarization-Diversity Loop Configuration Preliminary Study Quasi-One-Dimensional Regularization Technique Refractive Index Spatial Light Modulator(SLM) Two-Step Thermal Sensors Tracking Technique Object Image Pulsed-Laser Deposition(PLD) Infrared Absorption Beam Geometry Blood Cells Current Path Crystalline Grain Dynamic Tuning Experimental Data Electric Circuit Effective Medium Theory Film Thickness Fresh Dimension Field-Effect Transistors(FETs) High-Resolution Gate Dielectric Horizontal Axis Image Retrieval High-Tc Superconductors Input Data Internal Structure Laser Light Low-Temperature Plasma-Enhanced Atomic Layer Deposition Metal State Optimization Algorithm Postdeposition Annealing(PDA) Simultaneous Measurement Semiconductor Device Statistical Analysis Split-Ring Resonator Thickness Variation Thin-Film Devices Video Service Upper Limit Free Electrons Impurity Level Post-Annealing Process Strongly Correlated 3d Image Aperture Size Activation Energy Correlated Electron Systems Device Fabrication Electronic State Fresnel Diffraction Fundamental Limitation Force Microscopy Hybrid Structure Infrared Data Kernel Matrix Magnetic Particles Multi-Layer Network Oscillation Frequency Parallel-Beam Phase Coexistence Quantitative Analysis Spatial Resolution Resolution Enhancement Sampling Criterion Si Wafer Valence State Weighting Matrix Chebyshev Polynomials Of The Second Kind Free Carriers Image Formation Passive Circuits 3d Panel Far-Field And Near-Field As 2 Basis Vectors Computed Tomography(C.T) Electronic Properties Frequency Range Growth Temperature Gate Voltage Grain Boundaries Index Generation Infrared Study Kinetic Energy M-Plane Network Training Optical System Optical Properties Phase Change Pressure Range Spectral Weight Tele-Presence Total Variation Regularization Three-Dimensional Display Tensor Tomography Process-Voltage-Temperature(PVT) Wave Length Gaas Thin Films Mixed Phases Nonequilibrium State Display Applications Amorphous Films Atomic Force Microscope(AFM) Binocular Disparity Condition Number Carry Out Conduction Band Doping Amount Diffraction Tomography Exact Reconstruction Electrical Gating Experimental Approach Electromagnetic Properties Fourier Transform Inverse System Initial Stage Induced Resistance Image Reduction Liquid Crystal Display(LCD) Laser Beams Linear Characteristic Memory Device Multi-View Magnetic Particle Imaging Nyquist Sampling Normal Incidence Network Performance Nonlinear Activation Function Oriented Films One-Dimensional Chains Potential Applications Spectrum Expansion Sparse-View Ct Standard Resistor Single-Crystalline Transition Regime Time Scale Two-Terminal Device Two-Dimensional(2D) Vanadium Sesquioxide Voltage Source W-Doped Electrical Oscillation Free Region Infrared Properties Metallic Islands Video System 3d Display Key Role Aliasing Effect Electrical Characteristics Frequency-Agile Frequency Response(FreRes) Fiber Optic Growth Method Infrared Image Lcd Panel Light Guide Low-Valent Learning-Based Microscopic Observation Mean Curvature Micro-Electro-Mechanical System(MEMS) Optical Diffraction Order Structure Optical Conductivity P-Type Preferred Orientation Quasi-Particle Resistance Variation Shrinkage Algorithm Single-Layer Network Spatial Harmonic Ti-Doped Temperature Dependence Interference Filter Reducing Gases Theoretical Analysis 1550 Nm 3d Video Particle Mass Applied Voltage Angular Spectrum Chamber Pressure Critical Temperature Charge Dynamics Doping Concentration Joule Heating Electrical Devices Extended Dipole Model Frequency Bandwidth Growth Conditions High Resistance High Numerical Aperture Image Space Large Screen Low Noise Metal Ion Optical Transition Pump-Probe Measurements Phase Retrieval Recovery Method Retrieval Performance Reflectance Measurements Reconstruction Process System Architecture Scanning Electron Microscope Small Change Twist Algorithm Ti Doping Uniform Image Xrd Data Hidden Layer High Electric Field Oxygen Ambient