ETRI-Knowledge Sharing Plaform

Metal-Insulator Transition Holographic Display Fresnel Hologram Numerical Simulations Mott Transition Insulator-To-Metal Transition Vanadium Dioxide Films First-Order Resistance Change Sol-Gel Method Digital Hologram Focal Length Si Substrate Annealing Temperature Rf-Magnetron Sputter Deposition Structural Phase Transition Applied Physics Infrared Microscopy Vanadium Oxide Charge Carriers Increasing Temperature Metal Phase Transition Temperature Large-Scale High Order Wide Viewing Angle Fourier Hologram Sol-Gel Process Fourier Holographic Metallic State On-Axis System Matrix Tilted Plane Focal Plane Image Deformation Vanadium Dioxide Thin Film Comparative Analysis Deep Learning(DL) Hole Doping Plane Wave Polarization-Insensitive Room-Temperature Strain And Temperature Surface Morphology Sio 2 Abrupt Change Correlated Insulator Correlated Material Hologram Aperture Sputter Deposition Technique Temperature Sensor(LM35) Viewing Window VO 2 Display System Holographic Imaging Image Size Lens Array Light Sources Self-Similarity Affine Transformation Coulomb Repulsion Faraday Rotator Mirror Image Recovery Infrared Spectroscopy(FT-IR in real time) Long-Period Fiber Grating(LPFG) Low Pressure Pupil Tracking Electronic Correlations High-Birefringent Fiber Nano-Imaging Optical Fiber Point Spread Function(PSF) Reconstructed Image Wide-Angle Correlated Metal Field Of View(FOV) Far-Infrared Image Reconstruction Memristive System Second-Order 3d Scenes As-Deposited Film Amplitude Contrast Backlight System Control Systems Dielectric Tensor Electrical Properties(I-V curve) Frequency Tuning Iterative Shrinkage-Thresholding Intermediate Phase Interface Region Laser-Assisted Motor Control Matrix Element Nanoparticle Size Neural Network Architecture Optical Constants O 3 Polarized Light Projection System Process Temperature Phase Gradient Resonance Frequency Real-Time Tuning Sensing Scheme Tuning Effect Tracking System Valence Band X-Ray Phase-Contrast Imaging W Doping Beam Splitter Coherent Phonon Constant Voltage(CV) Electrostatic Doping Femtosecond Pump-Probe Focused Laser High-Precision Image Generation Imaging Plane Low Concentration Mems Mirror Network Image Object Image Operating Pressure Polarization-Independent Polarization-Diversity Loop Configuration Pulsed-Laser Deposition(PLD) Preliminary Study Quasi-One-Dimensional Regularization Technique Refractive Index Spatial Light Modulator(SLM) Two-Step Thermal Sensors Tracking Technique Infrared Absorption Beam Geometry Blood Cells Current Path Crystalline Grain Dynamic Tuning Experimental Data Electric Circuit Effective Medium Theory Free Electrons Film Thickness Fresh Dimension Field-Effect Transistors(FETs) High-Resolution Gate Dielectric Horizontal Axis Image Retrieval High-Tc Superconductors Input Data Internal Structure Impurity Level Laser Light Low-Temperature Plasma-Enhanced Atomic Layer Deposition Metal State Optimization Algorithm Post-Annealing Process Postdeposition Annealing(PDA) Simultaneous Measurement Semiconductor Device Strongly Correlated Statistical Analysis Split-Ring Resonator Thickness Variation Thin-Film Devices Video Service Upper Limit 3d Image Aperture Size Activation Energy Chebyshev Polynomials Of The Second Kind Correlated Electron Systems Device Fabrication Electronic State Fresnel Diffraction Fundamental Limitation Free Carriers Force Microscopy Hybrid Structure Image Formation Infrared Data Kernel Matrix Magnetic Particles Multi-Layer Network Oscillation Frequency Parallel-Beam Phase Coexistence Passive Circuits Quantitative Analysis Spatial Resolution Resolution Enhancement Sampling Criterion Si Wafer Valence State Weighting Matrix 3d Panel Far-Field And Near-Field As 2 Basis Vectors Computed Tomography(C.T) Electronic Properties Frequency Range Gaas Thin Films Growth Temperature Gate Voltage Grain Boundaries Index Generation Infrared Study Kinetic Energy M-Plane Mixed Phases Nonequilibrium State Network Training Optical System Optical Properties Phase Change Pressure Range Spectral Weight Tele-Presence Total Variation Regularization Three-Dimensional Display Tensor Tomography Process-Voltage-Temperature(PVT) Wave Length Display Applications Amorphous Films Atomic Force Microscope(AFM) Binocular Disparity Condition Number Carry Out Conduction Band Doping Amount Diffraction Tomography Exact Reconstruction Electrical Gating Experimental Approach Electromagnetic Properties Electrical Oscillation Free Region Fourier Transform Inverse System Initial Stage Infrared Properties Induced Resistance Image Reduction Liquid Crystal Display(LCD) Laser Beams Linear Characteristic Memory Device Metallic Islands Multi-View Magnetic Particle Imaging Nyquist Sampling Normal Incidence Network Performance Nonlinear Activation Function Oriented Films One-Dimensional Chains Potential Applications Spectrum Expansion Sparse-View Ct Standard Resistor Single-Crystalline Transition Regime Time Scale Two-Terminal Device Two-Dimensional(2D) Video System Vanadium Sesquioxide Voltage Source W-Doped 3d Display Key Role Aliasing Effect Electrical Characteristics Frequency-Agile Frequency Response(FreRes) Fiber Optic Growth Method Interference Filter Infrared Image Lcd Panel Light Guide Low-Valent Learning-Based Microscopic Observation Mean Curvature Micro-Electro-Mechanical System(MEMS) Optical Diffraction Order Structure Optical Conductivity P-Type Preferred Orientation Quasi-Particle Resistance Variation Reducing Gases Shrinkage Algorithm Single-Layer Network Spatial Harmonic Ti-Doped Theoretical Analysis Temperature Dependence 1550 Nm 3d Video Particle Mass Applied Voltage Angular Spectrum Chamber Pressure Critical Temperature Charge Dynamics Doping Concentration Joule Heating Electrical Devices Extended Dipole Model Frequency Bandwidth Growth Conditions High Resistance High Numerical Aperture Hidden Layer High Electric Field Image Space Large Screen Low Noise Metal Ion Oxygen Ambient Optical Transition Pump-Probe Measurements Phase Retrieval Recovery Method Retrieval Performance Reflectance Measurements Reconstruction Process System Architecture Scanning Electron Microscope Small Change Twist Algorithm Ti Doping Uniform Image Xrd Data