Subjects :
I-V measurement
논문 검색결과
| Type |
Year |
Title |
Cited |
Download |
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Journal
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2020 |
Charging Effect by Fluorine-Treatment and Recess Gate for Enhancement-Mode on AlGaN/GaN High Electron Mobility Transistors
Kang Soo Cheol Nanomaterials, v.10, no.11, pp.1-9 |
5 |
원문
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|
Journal
|
2016 |
Surface Al Doping of 4H-SiC Via Low Temperature Annealing
Junbo Park Applied Physics Letters, v.109, no.3, pp.1-5 |
5 |
원문
|
|
Journal
|
2014 |
Simple Technique for Evaluating Dimensional and Compositional Changes in Selective-Area-Grown MQW Laser Diode
Kwon Oh Kee Optics Express, v.22, no.19, pp.23694-23703 |
4 |
원문
|
|
Journal
|
2013 |
Effect of Silicide/Silicon Hetero-Junction Structure on Thermal Conductivity and Seebeck Coefficient
Choi Won Chul Journal of Nanoscience and Nanotechnology, v.13, no.12, pp.7801-7805 |
6 |
원문
|
|
Journal
|
2013 |
Negative-Differential-Resistance-Switching Si-Transistor Operated by Power Pulse and Identity of Zener Breakdown
Hyun-Tak Kim Applied Physics Letters, v.103, no.17, pp.1-3 |
2 |
원문
|
|
Journal
|
2012 |
Characteristics of NiO–AZO thin films deposited by magnetron co-sputtering in an O2 atmosphere
H.W. Park Materials Letters, v.74, pp.30-32 |
13 |
원문
|
특허 검색결과
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연구보고서 검색결과
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