Subjects :
Device reliability
논문 검색결과
| Type |
Year |
Title |
Cited |
Download |
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Journal
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2025 |
Low-temperature hybrid microwave annealing process for high-performance indium–tungsten oxide thin-film transistors
Lim Seonghwan Applied Physics Letters, v.127, no.9, pp.1-7 |
0 |
원문
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Journal
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2025 |
Low-temperature hybrid microwave annealing process for high-performance indium–tungsten oxide thin-film transistors
최현식 Applied Physics Letters, v.127, no.9, pp.1-7 |
0 |
원문
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Conference
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2018 |
Thermal Analysis of SiC Power Semiconductor with Copper Clip Bonding and Copper Sintering Paste
Inhoo Kim International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) 2018, pp.1-4 |
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Journal
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2018 |
Improvement in Cyclic Operation of Unit Pixel Device using Sb-excess Ge2Sb2Te5 Thin Films for Hologram Image Implementation
Hanbyeol Kang Japanese Journal of Applied Physics, v.57, no.8, pp.1-6 |
5 |
원문
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Journal
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2017 |
High Temperature Storage Test and Its Effect on the Thermal Stability and Electrical Characteristics of AlGaN/GaN High Electron Mobility Transistors
Jongmin Lee Current Applied Physics, v.17, no.2, pp.157-161 |
16 |
원문
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Journal
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2010 |
Device Reliability under Electrical Stress and Photo Response of Oxide TFTs
Park Sang-Hee Journal of the Society for Information Display, v.18, no.10, pp.779-788 |
12 |
원문
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Journal
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2008 |
Bilayer Heater Electrode for Improving Reliability of Phase-Change Memory Devices
Lee Seung-Yun Journal of the Electrochemical Society, v.115, no.5, pp.H314-H318 |
7 |
원문
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Journal
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2007 |
Nanoscale Observations of the Operational Failure for Phase-change-type Nonvolatile Memory Devices using Ge2Sb2Te5 Chalcogenide Thin Films
Yoon Sung Min Applied Surface Science, v.254, no.1, pp.316-320 |
51 |
원문
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연구보고서 검색결과
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Year |
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