ETRI-Knowledge Sharing Plaform

Creative Technology III-V Single Photon Source Threading Dislocations(TDs) High Temperature Inas/Gaas Quantum Dot Threading Dislocation Density Low Temperature(LT) Atomically Flat Surface Si Gaas Transmission Electron Microscopy(TEM) Electron Channeling Contrast Imaging Indium Gallium Arsenide Organic Vapor Gaas Films Continuous Wave(CW) Highly Efficient Peak Intensity Surface Morphology Telecom Wavelength Aluminum Gallium Arsenide Inas Qds Indium Gallium Phosphide Inp Quantum Dot Lattice Matched Quantum Dot Laser Transformation Optics Controlled Growth Control Sample Direct Wafer Bonding Electron Microscope Growth Temperature Highly Strained Laser Applications Optical Properties Substrate Thickness Nonradiative Recombination Cladding Layer Cmos-Compatible Gaas On Si L-Band Laser Diode(LD) Strained Layer C-Band Very Large Scale Integration(VLSI) Root Mean Square Value Surface Leakage Current Temperature Dependence Wafer-Scale Integration Whispering Gallery Applied Bias Voltage Metalorganic Chemical Vapor Deposition Material Quality Microcavity Laser Si Substrate Vapor Phase Epitaxy