ETRI-Knowledge Sharing Plaform

Threading Dislocations(TDs) Single Photon Source Creative Technology III-V Low Temperature(LT) High Temperature Inas/Gaas Quantum Dot Threading Dislocation Density Atomically Flat Surface Si Gaas Transmission Electron Microscopy(TEM) Electron Channeling Contrast Imaging Gaas Films Indium Gallium Arsenide Organic Vapor Telecom Wavelength Continuous Wave(CW) Highly Efficient Peak Intensity Surface Morphology Transformation Optics Aluminum Gallium Arsenide Inas Qds Inp Quantum Dot Indium Gallium Phosphide Lattice Matched Quantum Dot Laser Growth Temperature Nonradiative Recombination Control Sample Controlled Growth Electron Microscope Direct Wafer Bonding Highly Strained Optical Properties Laser Applications Substrate Thickness Strained Layer Gaas On Si Cladding Layer Cmos-Compatible Laser Diode(LD) L-Band Temperature Dependence Wafer-Scale Integration Whispering Gallery C-Band Very Large Scale Integration(VLSI) Surface Leakage Current Root Mean Square Value Applied Bias Voltage Metalorganic Chemical Vapor Deposition Material Quality Microcavity Laser Vapor Phase Epitaxy Si Substrate