|
Journal
|
2025 |
Investigation of Chlorine-Induced Damage in Oxide Semiconductor Transistors
Na Jae Won ACS Applied Electronic Materials, v.7, no.13, pp.6128-6136 |
0 |
원문
|
|
Journal
|
2025 |
Millisecond Pulsed Light Annealing for Improving Performance of Top-Gate Self-Aligned a-IGZO TFT
김희태 IEEE Transactions on Electron Devices, v.72, no.5, pp.2399-2405 |
1 |
원문
|
|
Journal
|
2024 |
Tuning the Threshold Voltage of an Oxide Thin-Film Transistor by Electron Injection Control Using a p−n Semiconductor Heterojunction Structure
Jung Hoon Han ACS Applied Materials & Interfaces, v.16, no.24, pp.31254-31260 |
2 |
원문
|
|
Journal
|
2018 |
Highly Stable AlInZnSnO and InZnO Double-Layer Oxide Thin-Film Transistors With Mobility Over 50 cm2/V·s for High-Speed Operation
Yang Jong-Heon IEEE Electron Device Letters, v.39, no.4, pp.508-511 |
41 |
원문
|
|
Journal
|
2017 |
Impact of Transient Currents Caused by Alternating Drain Stress in Oxide Semiconductors
이현준 Scientific Reports, v.7, pp.1-9 |
25 |
원문
|
|
Journal
|
2017 |
Impact of Transient Currents Caused by Alternating Drain Stress in Oxide Semiconductors
Cho Sung Haeng Scientific Reports, v.7, pp.1-9 |
25 |
원문
|
|
Journal
|
2013 |
Comparative studies on electrical bias temperature instabilities of In–Ga–Zn–O thin film transistors with different device configurations
Ryu Min Ki Solid-State Electronics, v.89, pp.171-176 |
21 |
원문
|
|
Journal
|
2012 |
Effect of Oxygen Binding Energy on the Stability of Indium-Gallium-Zinc-Oxide Thin-Film Transistors
Cheong Woo-Seok ETRI Journal, v.34, no.6, pp.966-969 |
8 |
원문
|
|
Journal
|
2011 |
Electrical Properties of Top-Gate Oxide Thin-Film Transistors with Double-Channel Layers
Cheong Woo-Seok Journal of Crystal Growth, v.326, no.1, pp.186-190 |
9 |
원문
|
|
Conference
|
2009 |
Oxide TFT Structure Affecting the Device Performance
Park Sang-Hee 한국정보디스플레이학회 학술 대회 2009, pp.385-388 |
|
|