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Journal
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2016 |
Double-layered Ag–Al back reflector on stainless steel substrate for a-Si:H thin film solar cells
Jung Kwang Hoon Solar Energy Materials & Solar Cells, v.145, no.3, pp.368-374 |
17 |
원문
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Journal
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2015 |
CCQM pilot study CCQM-P140: quantitative surface analysis of multi-element alloy films
김경중 Metrologia, v.52, no.Technical Suppl., pp.1-28 |
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원문
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Journal
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2013 |
Depinning of the Fermi Level at the Ge Schottky Interface through Se Treatment
V. Janardhanam Scripta Materialia, v.69, no.11-12, pp.809-811 |
11 |
원문
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Journal
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2013 |
Accurate Quantification of Cu(In,Ga)Se2 Films by AES Depth Profiling Analysis
장종식 Applied Surface Science, v.282, pp.777-781 |
8 |
원문
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Journal
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2012 |
Quantitative Analysis of Cu(In,Ga)Se2 Thin Films by Secondary Ion Mass Spectrometry Using a Total Number Counting Method
장종식 Metrologia, v.49, no.4, pp.522-529 |
12 |
원문
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Journal
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2009 |
Evaluation of 1/f Noise Characteristics for Si-Based Infrared Detection Materials
Ryu Hojun ETRI Journal, v.31, no.6, pp.703-708 |
3 |
원문
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Conference
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2008 |
Sputtered Silicon Antimony Thin Film for The Infrared Detection Layer of Microbolometer
Ryu Hojun SENSORS 2008, pp.301-304 |
0 |
원문
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Conference
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2008 |
1/f Noise Characteristics of Sputtered Silicon Antimony Thin Film for Microbolometer
Ryu Hojun Eurosensors 2008, pp.877-880 |
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Journal
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2007 |
Electrical Characterization of Nonvolatile Phase-Change Memory Devices Using Sb-Rich Ge–Sb–Te Alloy Films
Yoon Sung Min Japanese Journal of Applied Physics, v.46, no.11, pp.7225-7231 |
17 |
원문
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Conference
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2007 |
Novel Process for the Electrodes of Microbolometer
Ryu Hojun International Conference on Sensor Technologies and Applications (SENSORCOMM) 2007, pp.10-13 |
1 |
원문
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