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Journal
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2025 |
Ligand-Assisted Purification of Mixed-Halide Perovskite Nanocrystals with Near-Unity PLQY for High-Color-Purity Display Applications
Kim Joo Yeon Materials, v.18, no.21, pp.1-11 |
0 |
원문
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Journal
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2025 |
Ligand-Assisted Purification of Mixed-Halide Perovskite Nanocrystals with Near-Unity PLQY for High-Color-Purity Display Applications
Stephy Jose Materials, v.18, no.21, pp.1-11 |
0 |
원문
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Journal
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2025 |
Investigation of Chlorine-Induced Damage in Oxide Semiconductor Transistors
Na Jae Won ACS Applied Electronic Materials, v.7, no.13, pp.6128-6136 |
0 |
원문
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Journal
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2022 |
Anomalous Photocurrent Reversal Due to Hole Traps in AlGaN-Based Deep-Ultraviolet Light-Emitting Diodes
Seungyoung Lim Micromachines, v.13, no.8, pp.1-10 |
2 |
원문
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Journal
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2018 |
Mechanistic Understanding of Improved Performance of Graphene Cathode Inverted Organic Light-Emitting Diodes by Photoemission and Impedance Spectroscopy
Jaehyun Moon ACS Applied Materials & Interfaces, v.10, no.31, pp.26456-26464 |
8 |
원문
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Journal
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2018 |
High Performance SONOS Flash Memory with In-Situ Silicon Nanocrystals Embedded in Silicon Nitride Charge Trapping Layer
임재갑 Solid-State Electronics, v.140, pp.134-138 |
14 |
원문
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Journal
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2012 |
Subthreshold Characteristics of Pentacene Field-Effect Transistors Influenced by Grain Boundaries
Park Jae Hoon Journal of Applied Physics, v.111, no.10, pp.1-6 |
13 |
원문
|
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Journal
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2009 |
Comparative Study of Electrical Instabilities in Top-Gate InGaZnO thin Film Transistors with Al2O3 and Al2O3/SiNx Gate Dielectrics
이정민 Applied Physics Letters, v.94, no.22, pp.1-4 |
111 |
원문
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Journal
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2009 |
Fabrication of N- and P-Channel Schottky Barrier Thin-Film Transistors Crystallized by Excimer Laser Annealing and Solid Phase Crystallization Methods
신진욱 Japanese Journal of Applied Physics, v.48, no.4, pp.1-4 |
0 |
원문
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Journal
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2007 |
Analysis of Interface Trap States at Schottky Diode by using Equivalent Circuit Modeling
Jun Myung Sim Journal of Vacuum Science and Technology B, v.25, no.1, pp.82-85 |
5 |
원문
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Conference
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2006 |
New Analysis on the Interface Trap States at Schottky Contact
Jun Myung Sim International Conference on the Physics of Semiconductors (ICPS) 2006, pp.1-2 |
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