ETRI-Knowledge Sharing Plaform

III-V Low Temperature(LT) Single-Photon Source Threading Dislocations(TDs) High Temperature Inas/Gaas Quantum Dot Threading Dislocation Density Creative Technology Si Gaas Transmission Electron Microscopy(TEM) Atomically Flat Surface Gaas Films Indium Gallium Arsenide Electron Channeling Contrast Imaging Organic Vapor Highly Efficient Continuous Wave(CW) Surface Morphology Telecom Wavelength Peak Intensity Inas Qds Indium Gallium Phosphide Transformation Optics Inp Quantum Dot Aluminum Gallium Arsenide Quantum Dot Laser Lattice Matched Growth Temperature Highly Strained Control Sample Direct Wafer Bonding Laser Applications Nonradiative Recombination Optical Properties Controlled Growth Electron Microscope Substrate Thickness Gaas On Si Cmos-Compatible L-Band Cladding Layer Strained Layer Laser Diode(LD) C-Band Temperature Dependence Wafer-Scale Integration Whispering Gallery Very Large Scale Integration(VLSI) Root Mean Square Value Surface Leakage Current Metalorganic Chemical Vapor Deposition Microcavity Laser Si Substrate Vapor Phase Epitaxy Applied Bias Voltage Material Quality