Subject

Subjects : current stress

  • Articles (9)
  • Patents (0)
  • R&D Reports (0)
논문 검색결과
Type Year Title Cited Download
Journal 2025 Mitigating hydrogen-related instabilities in oxide thin-film transistor via nitrogen-engineered passivation layer for thermal stability   이이삭  Applied Surface Science Advances, v.29, pp.1-11 0 원문
Journal 2025 Mitigating hydrogen-related instabilities in oxide thin-film transistor via nitrogen-engineered passivation layer for thermal stability   Na Jae Won  Applied Surface Science Advances, v.29, pp.1-11 0 원문
Conference 2022 Attention-LRCN: Long-term Recurrent Convolutional Network for Stress Detection from Photoplethysmography   최지호  International Symposium on Medical Measurements and Applications (MeMeA) 2022, pp.1-5 12 원문
Journal 2012 Effect of Oxygen Binding Energy on the Stability of Indium-Gallium-Zinc-Oxide Thin-Film Transistors   Cheong Woo-Seok  ETRI Journal, v.34, no.6, pp.966-969 8 원문
Journal 2012 Effect of In-Ga-Zn-O Active Layer Channel Composition on Process Temperature for Flexible Oxide Thin-film Transistors   박준용  Journal of Vacuum Science and Technology B, v.30, no.4, pp.1-5 20 원문
Journal 2012 Current Stress Induced Electrical Instability in Transparent Zinc Tin Oxide Thin-Film Transistors   Cheong Woo-Seok  Journal of Nanoscience and Nanotechnology, v.12, no.4, pp.3421-3424 18 원문
Journal 2011 Light Response of Top Gate InGaZnO Thin Film Transistor   Park Sang-Hee  Japanese Journal of Applied Physics, v.50, no.3S, pp.1-4 7 원문
Journal 2009 Effects of Interfacial Dielectric Layers on the Electrical Performance of Top-Gate In-Ga-Zn-Oxide Thin-Film Transistors   Cheong Woo-Seok  ETRI Journal, v.31, no.6, pp.660-666 26 원문
Conference 2009 P‐8: Effects of Active Thickness in Oxide Semiconductor TFTs   Hwang Chi-Sun  Society for Information Display (SID) International Symposium 2009, pp.1107-1109 11 원문
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