Journal
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2009 |
Improvement of operational stability in SET states of phase-change-type nonvolatile memory devices using Sb-rich phase of Ge–Sb–Te alloys
Sung Min Yoon
Solid-State Electronics, v.53, no.5, pp.557-561 |
6 |
|
Journal
|
2009 |
Reception Power Estimation Using Transmitter Identification Signal for Single Frequency Network
Sung Ik Park
IEEE Transactions on Broadcasting, v.55, no.3, pp.652-655 |
18 |
|
Journal
|
2009 |
Associative Naïve Bayes classifier: Automated linking of gene ontology to medline documents
Hyun Ki Kim
Pattern Recognition, v.42, no.9, pp.1777-1785 |
18 |
|
Journal
|
2009 |
Fabrication and Electrical Properties of Ordered Two-Dimensional Hollow ZnO Shells’ Arrays
Jae Hyun Moon
Journal of Physics and Chemistry of Solids, v.70, no.8, pp.1166-1170 |
1 |
|
Journal
|
2009 |
Automated Speaker Recognition for Home Service Robots Using Genetic Algorithm and Dempster–Shafer Fusion Technique
Yanmei Zhan IEEE Transactions on Instrumentation and Measurement, v.58, no.9, pp.3058-3068 |
41 |
|
Journal
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2009 |
Charge Transfer and Trapping Properties in Polymer Gate Dielectrics for Non-Volatile Organic Field-Effect Transistor Memory Applications
Kang Jun Baeg Solid-State Electronics, v.53, no.11, pp.1165-1168 |
23 |
|
Journal
|
2009 |
Effects of Chemical Treatments on the Electrical Behaviors of Ferroelectric Poly(Vinylidene Fluoride-Trifluoroethylene) Copolymer for Nonvolatile Memory Device Applications
Sung Min Yoon
Japanese Journal of Applied Physics, v.48, no.9, pp.1-4 |
3 |
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Journal
|
2009 |
Integrated Assembly Line Balancing with Resource Restrictions
llk Yeong Moon International Journal of Production Research, v.47, no.19, pp.5525-5541 |
38 |
|
Journal
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2009 |
Impact of Sn/Zn Ratio on the Gate Bias and Temperature-Induced Instability of Zn-In-Sn-O thin Film Transistors
Min Ki Ryu
Applied Physics Letters, v.95, no.17, pp.173508-1-173508-3 |
105 |
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Journal
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2009 |
Impact of device configuration on the temperature instability of Al–Zn–Sn–O thin film transistors
Jae Kyeong Jeong
Applied Physics Letters, v.95, no.12, pp.123505-1-123505-3 |
60 |
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