Subjects :
Annealing conditions
논문 검색결과
| Type |
Year |
Title |
Cited |
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Journal
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2023 |
Effects of Interfacial Electron Transport on Field Electron Emission from Carbon Nanotube Paste Emitters
Kim Jae-Woo ACS Applied Materials & Interfaces, v.15, no.42, pp.49854-49864 |
4 |
원문
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Journal
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2023 |
Effects of Interfacial Electron Transport on Field Electron Emission from Carbon Nanotube Paste Emitters
Ko Eunsol ACS Applied Materials & Interfaces, v.15, no.42, pp.49854-49864 |
4 |
원문
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Journal
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2020 |
Optimized Annealing Conditions to Enhance Stability of Polarization in Sputtered HfZrOx Layers for Non-volatile Memory Applications
Kim Yeriaron Current Applied Physics, v.20, no.12, pp.1441-1446 |
17 |
원문
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Journal
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2017 |
The role of oxygen in dramatically enhancing the electrical properties of solution-processed Zn–Sn–O thin-film transistors
Chosy Journal of Materials Chemistry C : Materials for Optical and Electronic Devices, v.26, pp.6521-6526 |
15 |
원문
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Journal
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2016 |
Solution-processed Indium-free ZnO/SnO2 Bilayer Heterostructures as a Low-temperature Route to High-performance Metal Oxide Thin-film Transistors with Excellent Stabilities
Sooji Nam Journal of Materials Chemistry C : Materials for Optical and Electronic Devices, v.4, no.47, pp.11298-11304 |
45 |
원문
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Conference
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2012 |
Electronic Characteristics of ZnO Thin Film Transistors by Low-temperature Process
Lim Sang Chul International Meeting on Information Display (IMID) 2012, pp.1-2 |
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Journal
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2009 |
Growth and Properties of Sb-doped ZnMgO Thin Films Deposited Usingrf Magnetron Sputtering
Chung Sung Mook Journal of the Korean Physical Society, v.55, no.3, pp.1123-1127 |
2 |
원문
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Journal
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2009 |
Electrical, Structural and Optical Characterization of Copper Oxide thin Films as a Function of Post Annealing Temperature
V. Figueiredo Physica Status Solidi (A), v.206, no.9, pp.2143-2148 |
72 |
원문
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Journal
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2007 |
Structural Change and Its Electrooptical Effects on Terahertz Radiation with Post-Growth Annealing of Low-Temperature-Grown GaAs
Youn Doo Hyeb Japanese Journal of Applied Physics, v.46, no.10, pp.6514-6518 |
1 |
원문
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특허 검색결과
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