Subject

Subjects : AlGaN/GaN heterostructure

  • Articles (21)
  • Patents (0)
  • R&D Reports (0)
논문 검색결과
Type Year Title Cited Download
Conference 2023 Fabrication of AlGaN/GaN Heterostructure FET using Multi-Step Ohmic Annealing Process   Kim Zin-Sig  한국반도체 학술대회 (KCS) 2023, pp.746-746
Journal 2021 Thermal Behavior of an AlGaN/GaN-based Schottky Barrier Diode on Diamond and Silicon Substrates   Kim Zin-Sig  Journal of Nanoscience and Nanotechnology, v.21, no.8, pp.4429-4435 원문
Journal 2020 Effects of Recess Depth Under the Gate Area on the V th-Shift for Fabricating Normally-Off Field Effect Transistors on AlGaN/GaN Heterostructures   Kim Zin-Sig  Journal of Nanoscience and Nanotechnology, v.20, no.7, pp.4170-4175 원문
Journal 2020 Recess-Etched and Tetramethylammonium Hydroxide-Treated Nanoscale Pattern on AlGaN/GaN High-Electron-Mobility-Transistors for Improved Ohmic Contact   도재원  Journal of the Korean Physical Society, v.76, no.9, pp.837-842 0 원문
Journal 2020 Recess-Etched and Tetramethylammonium Hydroxide-Treated Nanoscale Pattern on AlGaN/GaN High-Electron-Mobility-Transistors for Improved Ohmic Contact   Jung Hyunwook  Journal of the Korean Physical Society, v.76, no.9, pp.837-842 0 원문
Conference 2019 Normally-off Field Effect Transistors using fine controlled Recess under Gate Area on AlGaN/GaN Heterostructures   Kim Zin-Sig  대한전자공학회 학술 대회 (추계) 2019, pp.215-218
Journal 2019 Thermal Properties of Schottky Barrier Diode on AlGaN/GaN Heterostructures on Chemical Vapor Deposition Diamond   Kim Zin-Sig  Journal of Nanoscience and Nanotechnology, v.19, no.10, pp.6119-6122 원문
Conference 2019 Effects of Recess Depth on the Vth-shift for Fabricating Normally-off Field Effect Transistors on AlGaN/GaN Heterostructures   Kim Zin-Sig  한국 반도체 학술 대회 (KCS) 2019, pp.618-619
Journal 2019 Growth of AlGaN/GaN Heterostructure with Lattice-matched AlIn(Ga)N Back Barrier   김정길  Solid-State Electronics, v.152, pp.24-28 9 원문
Conference 2018 Thermal Properties of Schottky Barrier Diode on AlGaN/GaN Heterostructures on CVD Diamond   Kim Zin-Sig  대한전자공학회 학술 대회 (하계) 2018, pp.195-198
Journal 2018 Ultra-low Rate Dry Etching Conditions for Fabricating Normally-off Field Effect Transistors on AlGaN/GaN Heterostructures   Kim Zin-Sig  Solid-State Electronics, v.140, pp.12-17 9 원문
Conference 2018 Thermal Properties of Schottky Barrier Diode on AlGaN/GaN Heterostructures on CVD Diamond   Kim Zin-Sig  한국 반도체 학술 대회 (KCS) 2018, pp.1-1
Conference 2017 Fabrication of Schottky Barrier Diodes on AlGaN/GaN Heterostructures on CVD Diamond Substrate   Kim Zin-Sig  Asia-Pacific Workshop on Widegap Semiconductors (APWS) 2017, pp.1-1
Journal 2017 Growth of 10 nm‐thick AlIn(Ga)N/GaN heterostructure with high electron mobility and low sheet resistance   김정길  Physica Status Solidi (B), v.254, no.8, pp.1-5 2 원문
Journal 2017 The Effects of Tetramethylammonium Hydroxide Treatment on the Performance of Recessed-gate AlGaN/GaN High Electron Mobility Transistors   Jae Won Do  Thin Solid Films, v.628, pp.31-35 10 원문
Conference 2016 Ultra-low Rate Dry Etching Conditions for Fabrication of Normally-off Field Effect Transistor on AlGaN/GaN Heterostructure   Kim Zin-Sig  International Symposium on the Physics of Semiconductors and Applications (ISPSA) 2016, pp.1-1
Conference 2016 Characteristic of Schottky Barrier Diode on AlGaN/GaN using Mo-based Ohmic Contact   Kim Zin-Sig  대한전자공학회 종합 학술 대회 (하계) 2016, pp.400-403
Journal 2015 Ohmic Contact to AlGaN/GaN Heterostructures on Sapphire Substrates   Kim Zin-Sig  Journal of the Korean Physical Society, v.66, no.5, pp.779-784 3 원문
Conference 2014 Formation of Ohmic Contact to AlGaN/GaN Heterostructure on Sapphire   Kim Zin Sig  한국진공학회 정기 학술 대회 (동계) 2014, pp.292-292
Journal 2007 Influence of a Strained AlGaN Overlayer on the GaN Matrix near AlGaN/GaN Heterointerfaces   이상준  Journal of the Korean Physical Society, v.51, no.3, pp.1050-1054 6 원문
Journal 2006 Experimental Evidence for Drude-Boltzmann-Like Transport in a Two-Dimensional Electron Gas in an AlGaN/GaN Heterostructure   Jing Han Chen  Journal of the Korean Physical Society, v.48, no.6, pp.1539-1543
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